BL 11.1R - XAFS | WayForLight

Elettra

BL 11.1R - XAFS

XAFS at Elettra is the beamline dedicated to x-ray absorption spectroscopy. It is installed on a bending magnet source and it was designed to cover a wide energy range: from 2.4 to 27 keV meeting the needs of a large number of researchers in the area of conventional x-ray absorption spectroscopy.
For this reason the research activity at the XAFS at Elettra is quite diverse and ranges from fundamental physics to catalysis to material and environmental science.

Publications Website

Beamline Energy Resolution

1 * 10^-4 [eV]
5 * 10^-5 [eV]

Beamline Energy Range

2.4 - 25 [keV]

Max Flux On Sample

10 * 10¹⁰ [ph/s] @ 9000 [eV]

Photon Sources

Bending magnet 2.0

Type

Bending Magnet

Available Polarization

Linear horizontal

Bending magnet 2.4

Type

Bending Magnet

Available Polarization

Linear horizontal

Monochromators

Kohzu with Si(111)

Energy Range

2400 - 18000 [eV]

Type

Crystal monochromator: Si 111

Resolving Power

0.0001 [deltaE/E]

Pre-focusing Mirror Type

cilindrical mirror Pt coated, grazing incidence: 3 mrad

Kohzu with Si(311)

Energy Range

4000 - 25000 [eV]

Resolving Power

5.0E-5 [deltaE/E]

Pre-focusing Mirror Type

cilindrical mirror Pt coated, grazing incidence: 3 mrad

contacts

Giuliana AQUILANTI

Luca OLIVI

Riccardo GRISONICH

Simone POLLASTRI

Techniques

Absorption

EXAFS
NEXAFS

Disciplines

Chemistry

Other - Chemistry

Earth Sciences & Environment

Other - Earth Sciences & Environment

Energy

Sustainable energy systems

Material Sciences

Knowledge based multifunctional materials
Other - Material Sciences

Physics

Atomic & molecular physics

control/Data analysis

Control Software Type

Labview

Data Output Type

spectra

Data Output Format

ascii

Softwares For Data Analysis

Ifeffit suite

Equipment That Can Be Brought By The User

Any equipment can be brought by the users. Please contact the beamline staff in advance