Elettra
BL 09.2 - APE

Advanced Photoelectric Effect experiments

APE (http://www.elettra.trieste.it/elettra-beamlines/ape.html) is a facility for spectroscopic investigation of solid surfaces and nanostructured matter for which the sample preparation and survey represent crucial and integral part of the experiment. The APE concept is based on a state-of-the-art surface science laboratory as a support facility for advanced spectroscopies at two distinct beamlines using polarized synchrotron radiation in the ultraviolet and soft X-ray range from the Elettra storage ring. A number of spectroscopic techniques (ARPES and SPIN-RESOLVED ARPES, XAS, XMCD/LD, XPS, Mott magnetometry) is therefore coupled with sophisticated off-line preparation/growth (including PLD) and characterization tools (atomically resolved STM, LEED-Auger, magneto-optical Kerr effect). From 2013 APE became an integral part of the NFFA project demonstrator (www.trieste.nffa.eu) that allowed for the integration of an extra suite of growth and analysis chambers with the APE beamlines

The integral setup became an open access facility for sample growth (metal oxide MBE with photon absorption calibrated sources, in situ PLD laser ablation, physical beam deposition from e-beam sources and sublimation cells for metallorganics, masking), sample characterization (LEED, Auger, XPS with laboratory source, MOKE at 1.1T with azimuthal analysis, Vectorial MOKE at 0.1T, in-situ atomic-resolution room temperature STM) and advanced on-line spectroscopic characterization, including spin-resolved ARPES that was also implemented within NFFA.

Beamline Energy Resolution
70 [meV] @ 400 [eV]
3 [meV] @ 50 [eV]
Beamline Resolving Power
1.75 * 10-4 [E/deltaE] @ 400 [eV]
6 * 10-5 [E/deltaE] @ 50 [eV]
Beamline Energy Range
10 - 1600 [eV]
Max Flux On Sample
1 * 1012 [ph/s] @ 50 [eV]
1 * 1012 [ph/s] @ 400 [eV]
Spot Size On Sample Hor
150 - 200 [um]
Spot Size On Sample Vert
50 - 70 [um]
Photon Sources

High energy undulator, Apple II type

Type
Undulator
Available Polarization
Linear horizontal, Linear vertical, Elliptical, Circular
Variable Polarization
Yes
Source Divergence Sigma
X = 39.92 [urad], Y = 27.55 [urad]
Source Size Sigma
X = 237.1 [um], Y = 17.777 [um]
Source Spectral Brightness
1.23298 * 1020 [ph/s/mrad^2/mm^2] @ 400 [eV]
Source Spectral Flux
5 * 1014 [ph/s/0.1%bw] @ 400 [eV]
Deflection Parameter K
1.12047
Energy Range
200 - 1600 [eV]
Total Power
70 [W]
Number Of Periods
36
Period
6 [cm]

Low energy undulator, Apple II type

Type
Undulator
Available Polarization
Linear horizontal, Linear vertical, Elliptical, Circular
Variable Polarization
Yes
Source Divergence Sigma
X = 88.02 [urad], Y = 83.15 [urad]
Source Size Sigma
X = 238.6 [um], Y = 31.89 [um]
Source Spectral Brightness
7.47759 * 1018 [ph/s/mrad^2/mm^2] @ 40 [eV]
Source Spectral Flux
3.70863 * 1014 [ph/s/0.1%bw] @ 40 [eV]
Deflection Parameter K
3.51549
Energy Range
10 - 100 [eV]
Total Power
156 [W]
Number Of Periods
17
Period
12.5 [cm]
Additional Lightsources

UV He discharge lamp

Type
Gas discharge lamp
Central Wavelength/Energy
21.2 [eV]
Beam shape
Gaussian
Monochromators

PGM high energy

Energy Range
200 - 1600 [eV]
Type
PGM
Resolving Power
1.75 * 10-4 [deltaE/E] @ 400 [eV]
Number Of Gratings
3
Grating Type
900 l/mm, 1400 l/mm, 1800 l/mm, variable line spacing, variable groove depth
Pre-focusing Mirror Type
Spherical
Refocusing Mirror Type
Torroidal

PGM low energy

Energy Range
10 - 90 [eV]
Type
PGM
Resolving Power
6 * 10-5 [deltaE/E] @ 50 [eV]
Number Of Gratings
3
Grating Type
700 l/mm, 1200 l/mm, 1600 l/mm, variable line spacing, variable groove depth
Pre-focusing Mirror Type
Spherical
Refocusing Mirror Type
Torroidal
Endstations or Setup

High energy end station

Spectrometer
Omicron EA125; resonant photoemission; XAS drain current and fluoressence
Base Pressure
1 * 10-10 [mbar]
Detectors Available
Hemispherical photoelectron analyzer
Electrometer for TEY
Photodiode for fluorescence
Endstation Operative
Yes

Manipulator or Sample stage

Sample Environment

Pressure (min)
1 * 10-5 [mbar]
Pressure (Max)
1 [bar]
Pressure (min)
1 * 10-10 [mbar]
Pressure (Max)
1 * 10-10 [mbar]
Temperature
50 - 650 [K]

Magnetic Fields

AC Fields
none
DC Fields
Pulsed
Max DC Field
1 * 10-1 [T]

Low energy end station

Spectrometer
Wide angular acceptance VG Scienta DA30 hemispherical electron energy analyzer for angle resolved photoemission spectroscopy; the analyzer has two channels at the detector plane where photoelectrons are extracted and further conducted to two VLEED (very low energy electron diffraction) targets for three-dimensional spin analysis.
More info on http://www.elettra.trieste.it/elettra-beamlines/ape.html.
Base Pressure
2 * 10-11 [mbar]
Detectors Available
Hemispherical photoelectron analyzer
Endstation Operative
Yes

Manipulator or Sample stage

Sample Environment

Pressure (min)
1 * 10-11 [mbar]
Pressure (Max)
5 * 10-11 [mbar]
Temperature
15 - 300 [K]
Detectors

Electrometer for TEY

Passive or Active (Electronics)
Active

Detection

Detected Particle
Electron

Hemispherical photoelectron analyzer

Type
Scienta-Omicron DA30 ARPES anayzer + VLEED spin detectors @ APE-LE
Omicron EA 100 @ APE-HE
Passive or Active (Electronics)
Active

Detection

Detected Particle
Electron

Photodiode for fluorescence

Type
Photodiode
Passive or Active (Electronics)
Active

Detection

Detected Particle
Photon
contacts
Giorgio Rossi (scientific coordinator)
Jun Fujii (technologist)
Giancarlo Panaccione (senior scientist)
Piero Torelli (scientist)
Ivana Vobornik (scientist; operation coordinator)
Techniques
Absorption
  • NEXAFS
  • UVCD
  • XMCD
Diffraction
  • Surface diffraction
Photoelectron emission
  • Angular Resolved PES
  • Photoelectron diffraction
  • Spin-resolved ARPES
  • UPS
  • XPS
Disciplines
Energy
  • Sustainable energy systems
Material Sciences
  • Knowledge based multifunctional materials
  • Other - Material Sciences
control/Data analysis
Control Software Type
  • Labview, Commercial spectrometer software (SES - Scienta-Omicron, Matrix - Omicron)
Data Output Type
  • spectra, images
Data Output Format
  • txt, Igor
Softwares For Data Analysis
  • Igor (commercial)
Equipment That Can Be Brought By The User
Evaporators; heating stages; UHV suitcases