Elettra
BL 01.2 L - Nanospectroscopy
Spectroscopic photoemission and low energy electron microscope (SPELEEM)
The study of nanostructured materials requires analytical methods that combine X-ray spectroscopy with electron microscopy. The Nanospectroscopy beamline at Elettra operates a state-of-the-art spectroscopic photoemission and low energy electron microscope (SPELEEM) which provides the users with a wide range of complementary methods providing structural, chemical and magnetic sensitivity. This powerful instrument reaches a lateral resolution of few tens nanometers. The microscope is served by a high photon flux beamline, which can deliver elliptically polarized photons in the range 50 eV to 1000 eV. Research applications typically address the characterization of surfaces, interfaces, thin films, micro and nanostructures in fields closely related to materials and surface sciences.
Beamline Energy Resolution
14 [meV] @ 100 [eV]
100 [meV] @ 400 [eV]
100 [meV] @ 400 [eV]
Beamline Resolving Power
7.5 * 103 [E/deltaE] @ 100 [eV]
4 * 103 [E/deltaE] @ 400 [eV]
4 * 103 [E/deltaE] @ 400 [eV]
Beamline Energy Range
25 - 1000 [eV]
Max Flux On Sample
1.5 * 1013 [ph/s] @ 150 [eV]
6.5 * 1011 [ph/s] @ 400 [eV]
6.5 * 1011 [ph/s] @ 400 [eV]
Spot Size On Sample Hor
20 - 30 [um]
Spot Size On Sample Vert
3 - 10 [um]
Angle Of Incidence Light On Sample Value
16 [degrees]
Photon Sources
2 Sasaki type elliptical undulators phased by an electromagnet
Type
Undulator
Available Polarization
Elliptical
Variable Polarization
Yes
Source Size Sigma
X = 39.2 [um], Y = 3 [um]
Source Spectral Flux
2.1 * 1018 [ph/s/0.1%bw] @ 400 [eV]
Energy Range
10 - 1000 [eV]
Number Of Periods
20
Period
10 [cm]
Additional Lightsources
Hg lamp
Type
Lamp
Central Wavelength/Energy
365 [nm]
Beam shape
Gaussian
Polarisation
Linear Horizontal
Monochromators
SG10 Spherical grating
Energy Range
10 - 50 [eV]
Type
SGM
Resolving Power
1000 [E/deltaE] @ 20 [eV]
Number Of Gratings
1
Grating Type
Spherical Grating
VLS 200 grating
Energy Range
50 - 300 [eV]
Type
Variable Line Spacing grating
Resolving Power
4000 [E/deltaE] @ 200 [eV]
Number Of Gratings
1
Grating Type
200 lines/mm
VLS 400 grating
Energy Range
100 - 1000 [eV]
Type
Variable Line Spacing Grating
Resolving Power
4000 [E/deltaE] @ 400 [eV]
Number Of Gratings
1
Grating Type
400 lines/mm
Endstations or Setup
SPELEEM III (Spectroscopic photoemission and low energy electron microscope)
Microscopes
Spectroscopic photoemission and low energy electron microscope (SPELEEM III, Elmitec GmbH), with magnetic triode objective and 120° separator.
Imaging techniques: LEEM, EELS-LEEM, XAS-PEEM, XMCD-PEEM, XMCLD-PEEM;
microspot diffraction techniques: μ-LEED, μ-ARUPS, μ-ARPES, μ-EELS, μ-XPD.
microspot spectroscopy techniques: μ-ARUPS, μ-ARPES, μ-XPD, μ-LEED, μ-EELS.
Contrast apertures : 10, 30 and 100 µm.
Illumination apertures (size on sample): 500 nm, 1 and 6 µm.
Lateral resolution: 10 nm in LEEM, 30 nm in XPEEM
Sample types: UHV compatible, flat with resistivity of few tens Ohms / cm
Imaging techniques: LEEM, EELS-LEEM, XAS-PEEM, XMCD-PEEM, XMCLD-PEEM;
microspot diffraction techniques: μ-LEED, μ-ARUPS, μ-ARPES, μ-EELS, μ-XPD.
microspot spectroscopy techniques: μ-ARUPS, μ-ARPES, μ-XPD, μ-LEED, μ-EELS.
Contrast apertures : 10, 30 and 100 µm.
Illumination apertures (size on sample): 500 nm, 1 and 6 µm.
Lateral resolution: 10 nm in LEEM, 30 nm in XPEEM
Sample types: UHV compatible, flat with resistivity of few tens Ohms / cm
Spectrometer
Hemispherical energy analyzer Elmitec R200
pass energy: 820 eV
energy resolution:
100 meV (spectral imaging)
100 meV (diffraction imaging)
60 meV (microspot spectroscopy)
pass energy: 820 eV
energy resolution:
100 meV (spectral imaging)
100 meV (diffraction imaging)
60 meV (microspot spectroscopy)
Base Pressure
7 * 10-11 [mbar]
Detectors Available
Retiga R6 CCD
flange mounted Chevron MCP
flange mounted Chevron MCP
Endstation Operative
Yes
Sample
Sample Type
Crystal, Amorphous
Other Sample Type
micro-structured, lithographically patterned samples
Mounting Type
Elmitec sample cartridge, custom designed sample cartridge
Required Sample Size
X = 9 [um], Y = 9 [um], Z = 1 [um]
Manipulator or Sample stage
Description
motorized sample tilt with minimum step size of 0.01°
Degrees Of Freedom
6
Translator Stages
2
Cradles
1
Positioning Precision
X = 66 [nm], Y = 66 [nm]
Sample Environment
Pressure (min)
7 * 10-11 [mbar]
Pressure (Max)
5 * 10-5 [mbar]
Temperature
100 - 2000 [K]
Sample Holders
Type
Custom made sample cartridge
Description
the cartridge allows applying magnetic fields up to 300 Gauss in-plane, normal to the beam propagation direction.
Sample heating is not possible.
Sample heating is not possible.
Type
custom made sample cartridge
Description
the cartridge allows applying magnetic fields up to 30 Gauss in the out-of-plane direction. Sample heating is not possible.
Type
Elmitec LEEM III
Description
This sample cartridge allows radiative and e-beam heating. It can perform prolonged sample annealing up to 1200 °C and short flashes up to 1600°C. The sample temperature is measured using a type C thermocouple.
Magnetic Fields
DC Fields
DC fields can be applied in the in-plane or out-of-plane directions in the main chamber of the SPELEEM microscope (but not in measurement position!).
Max DC Field
2 * 103 [Gauss]
Detectors
flange mounted Chevron MCP
Type
Advanced Performance Long-Life™ Microchannel Plate Detector with fiber optics viewport: APD 2 40/12/10/8 I 60:1 6"FM P20
Detection
Detected Particle
Electron
Retiga R6 CCD
Type
sensor type: Sony ICX-695 Scientific Interline CCD
Description
Quantum efficiency 75% at 600nm
Pixel Size
X = 4.54 [um], Y = 4.54 [um]
Array Size
X = 2688 [pixel], Y = 2200 [pixel]
Dynamic Range
1.6384 * 104 [bit]
Signal/NoiseRatio
5.5 [e-]
Output Readout Software
Elmitec UView2002 version 19.9.0
Detection
Detected Particle
Electron
Techniques
Absorption
- NEXAFS
- Time-resolved studies
- XMCD
Imaging
- Photoemission EM
- X-ray microscopy
Photoelectron emission
- Angular Resolved PES
- Time-resolved studies
- UPS
- XPS
Disciplines
Chemistry
- Catalysis
- Physical Chemistry
Material Sciences
- Other - Material Sciences
Physics
- Dynamics
- Hard condensed matter - electronic properties
- Hard condensed matter - structures
- Nanophysics & physics of confined matter
- Surfaces, interfaces and thin films
Address
Elettra-Sincrotrone Trieste S.C.p.A.
Strada Statale 14 - km 163,5 in AREA Science Park
34149 Basovizza, Trieste ITALY
Strada Statale 14 - km 163,5 in AREA Science Park
34149 Basovizza, Trieste ITALY
control/Data analysis
Control Software Type
- custom developed code written in Java; data acquisition is carried out by means Python (Jython) scripts
Data Output Type
- images, spectra
Data Output Format
- tiff 16 bit, ASCII files
Softwares For Data Analysis
- image suite based on Wavemetrics Igor Pro (Version 6 or later)
Equipment That Can Be Brought By The User
e-beam evaporators, Knudsen cells
