This beamlineprovides aworld class facility, using high-brightness sub-micron X-ray beams for the study of complex inhomogenous materials and systems under realistic conditions. The combination of the brilliance of a third generation synchrotronsource, and optics able to focus the beam to a micron sized spot, allows compositional, temporal and spatial information to begathered at high resolution.

On this beamline researchers can map elements in complex samples, follow chemical reactions, study real systems such as mineral samples returned from space, environmental samples and materials in hostile environments.