Reflectometer Experimental Station
This soft x-ray bending magnet beamline is equipped with a Plane Grating Monochromator operated in collimated light (collimated PGM). It uses the SX700-1 monochromator equipped with two blazed diffraction gratings produced in-house. The bending magnet beamline is optimised for moderate resolution at very high specular purity and efficient stray light reduction by a 4-mirror High order suppressor (HIOS) and a Filter and Slit Unit (FSU).
At this beamline a versatile reflectometer for at-wavelength metrology is coupled. This 10-axes instrument allows characterisation of real live-sized optical elements. This permanent endstation is located in a clean-room hutch.
The Optics Beamline with the reflectometer is primarily dedicated to the in-house R&D in optics development and at-wavelength metrology of our in-house produced diffraction gratings and (multilayer) optical elements.
Beamtime at this station is available by user-proposals or, at short-term request, by cooperation with our Institute for Nanometre Optics and Technology (FG-INT).
Reflectometry - At-wavelength metrology
The versatile 10 axes UHV-reflectometer is a permanent end station of the Optics Beamline delivering UV and XUV radiation. It is located in a clean-room hutch at DIP 1.1.
The samples are adjustable within six degrees of freedom, and the reflectivity can be measured at all incidence angles for both s- and p-polarisation geometry.
The reflectometer is primarily dedicated to the in-house R&D in optics development and at-wavelength metrology of our in-house produced diffraction gratings and (multilayer) optical elements.
Beamtime at this station is available by user-proposals or, at short-term request, by cooperation with our Institute for Nanometre Optics and Technology (FG-INT).
Film - click on Downloads in box on right side: reflectometer-film.mp4