"A versatile UHV-polarimeter for the EUV XUV spectral range is described which incorporates two optical elements: a phase retarder and a reflection analyzer. Both optics are azimuthally rotatable around the incident synchrotron radiation beam and the incidence angle is freely selectable. This allows for a variety of reflectometry, polarimetry and ellipsometry applications on magnetic or non-magnetic samples and multilayer optical elements." http://dx.doi.org/10.17815/jlsrf-2-90

• Polarimetry, Ellipsometry, Reflectometry
• Development of ML-optics for Polarisation Steering and Control
• Full control of Stokes vector (S1, S2, S3) in XUV-range (<1000 eV)
• Complete at-wavelength characterisiton of multilayer optics
• Measurement of complex reflection or transmission coefficients (Amplitudes and Phases)
• Polarisation Spectroscopy - Magneto-optics - XMCD, XMLD, T,L-MOKE, Faraday-, Kerr-effect

For more details contact the station scientist(s).